In our quest to commercialize SWNT tips as probes for AFM, Carbon Nanoprobes has devised techniques by which to grow the SWNT tips directly onto cantilever devices microfabricated onto Si wafers... <more>
PRODUCTS & SERVICES
In the near future CNP will be launching the Profiler™ series of carbon nanotube based atomic force microscopy probes. If you are an interested party, please contact us for more information on a special offer for our first customers.
Beta-Profiler™ Stop! Spending money on inferior images. Stop! Losing time replacing worn-down tips.
Start using next generation nanotube based CNP Beta-Profilers™.
CNP Beta-Profilers™ enable you to view smaller, narrower features,
while saving you precious time and money. <buy now><spec sheet>
Bio-profiler™ Series
The ultimate in resolution, these probes are designed to look at proteins in their native state...in under an hour <more>
Research-profiler™ Series These sub-2 nm probes are ideally suited for tapping mode investigations of surfaces, material characterizations, and nanostructure analysis <more>
Semi-profiler™ Series These high-aspect ratio, sub-10 nm probes are designed for semiconductor metrology applications at the 65 nm node and beyond <more>
Bio-profiler™ Series
Research-profiler™ Series
Semi-profiler™ Series